Richard QUINTANILHA

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Heidenheim an der Brenz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,692,948
- Issue date Jul 4, 2023
- ASML Netherlands B.V.
- Nitish Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tool, inspection method and computer program product
- Patent number 11,442,368
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Richard Quintanilha
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for calculating electromagnetic scattering pr...
- Patent number 11,347,151
- Issue date May 31, 2022
- ASML Netherlands B.V.
- Markus Gerardus Martinus Maria Van Kraaij
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230296533
- Publication date Sep 21, 2023
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION TOOL, INSPECTION METHOD AND COMPUTER PROGRAM PRODUCT
- Publication number 20210232052
- Publication date Jul 29, 2021
- ASML NETHERLANDS B.V.
- Richard QUINTANILHA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20200348244
- Publication date Nov 5, 2020
- ASML NETHERLANDS B.V.
- Nitish KUMAR
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Calculating Electromagnetic Scattering Pr...
- Publication number 20190346775
- Publication date Nov 14, 2019
- ASML NETHERLANDS B.V.
- Markus Gerardus Martinus Maria VAN KRAAIJ
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY