Richard R. LYNN

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Dual probing tip system
- Patent number 8,860,449
- Issue date Oct 14, 2014
- Tektronix, Inc.
- James E. Spinar
- G01 - MEASURING TESTING
Information Patent Grant
Probing tip for a signal acquisition probe
- Patent number 8,643,396
- Issue date Feb 4, 2014
- Tektronix, Inc.
- James E. Spinar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dual Probing Tip System
- Publication number 20120313658
- Publication date Dec 13, 2012
- Tektronix, Inc.
- JAMES E. SPINAR
- G01 - MEASURING TESTING
Information Patent Application
PROBING TIP FOR A SIGNAL ACQUISITION PROBE
- Publication number 20120306522
- Publication date Dec 6, 2012
- Tektronix, Inc.
- James E. SPINAR
- G01 - MEASURING TESTING