Richard R. Simmons

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,861,671
- Issue date Dec 8, 2020
- KLA Corporation
- Doug K. Masnaghetti
- G02 - OPTICS
Information Patent Grant
Backscattered electrons (BSE) imaging using multi-beam tools
- Patent number 10,460,905
- Issue date Oct 29, 2019
- KLA-Tencor Corporation
- Mark A. McCord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for noise mitigation in a multi-beam scanning ele...
- Patent number 10,366,862
- Issue date Jul 30, 2019
- KLA-Tencor Corporaton
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,325,753
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam dark field imaging
- Patent number 10,192,716
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,186,396
- Issue date Jan 22, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection site preparation
- Patent number 9,165,742
- Issue date Oct 20, 2015
- KLA-Tencor Corporation
- Richard Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,578,821
- Issue date Nov 26, 1996
- KLA Instruments Corporation
- Dan Meisberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,502,306
- Issue date Mar 26, 1996
- KLA Instruments Corporation
- Dan Meisburger
- G01 - MEASURING TESTING
Information Patent Grant
Automatic focusing system for a microscope
- Patent number 4,639,587
- Issue date Jan 27, 1987
- KLA Instruments Corporation
- Curt H. Chadwick
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...
- Publication number 20190172675
- Publication date Jun 6, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...
- Publication number 20170084424
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Noise Mitigation in a Multi-Beam Scanning Ele...
- Publication number 20170084423
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools
- Publication number 20170084421
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Mark A. McCord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Beam Dark Field Imaging
- Publication number 20170084422
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS

Richard R. Simmons

Person

Patents Grantslast 30 patents

Method and system for focus adjustment of a multi-beam scanning ele...

Backscattered electrons (BSE) imaging using multi-beam tools

Method and system for noise mitigation in a multi-beam scanning ele...

Method and system for focus adjustment of a multi-beam scanning ele...

Multi-beam dark field imaging

Method and system for focus adjustment of a multi-beam scanning ele...

Inspection site preparation

Electron beam inspection system and method

Electron beam inspection system and method

Automatic focusing system for a microscope

Patents Applicationslast 30 patents

Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...

Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...

Method and System for Noise Mitigation in a Multi-Beam Scanning Ele...

Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools

Multi-Beam Dark Field Imaging