Richard Schoonover

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Binghamton, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for automated extraction of a design for test...
- Patent number 8,732,632
- Issue date May 20, 2014
- Cadence Design Systems, Inc.
- Brion Keller
- G01 - MEASURING TESTING
Information Patent Grant
System to control insertion of care-bits in an IC test vector impro...
- Patent number 8,120,378
- Issue date Feb 21, 2012
- Cadence Design Systems, Inc.
- Joseph Swenton
- G01 - MEASURING TESTING
Information Patent Grant
Method and article of manufacture to generate IC test vector for sy...
- Patent number 7,821,276
- Issue date Oct 26, 2010
- Cadence Design Systems, Inc.
- Joseph Swenton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IC TEST VECTOR GENERATOR FOR SYNCHRONIZED PHYSICAL PROBING
- Publication number 20100321055
- Publication date Dec 23, 2010
- Cadence Design Systems, Inc.
- Joseph Swenton
- G01 - MEASURING TESTING
Information Patent Application
IC TEST VECTOR GENERATOR FOR SYNCHRONIZED PHYSICAL PROBING
- Publication number 20080284453
- Publication date Nov 20, 2008
- Cadence Design Systems, Inc.
- Joseph Swenton
- G01 - MEASURING TESTING