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Richard Schueller
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Chelmsford, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Convertible scan panel for x-ray inspection
Patent number
9,146,201
Issue date
Sep 29, 2015
American Science and Engineering, Inc.
Jeffrey Schubert
G01 - MEASURING TESTING
Information
Patent Grant
Multiple image collection and synthesis for personnel screening
Patent number
9,020,100
Issue date
Apr 28, 2015
America Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Grant
Methods to perform backscatter inspection of complex targets in con...
Patent number
8,923,481
Issue date
Dec 30, 2014
American Science and Engineering, Inc.
Jeffrey R. Schubert
G01 - MEASURING TESTING
Information
Patent Grant
Multiple image collection and synthesis for personnel screening
Patent number
8,605,859
Issue date
Dec 10, 2013
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection based on scatter detection
Patent number
8,194,822
Issue date
Jun 5, 2012
American Science and Engineering, Inc.
Peter Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Multiple image collection and synthesis for personnel screening
Patent number
7,809,109
Issue date
Oct 5, 2010
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Grant
Multiple image collection and synthesis for personnel screening
Patent number
7,796,734
Issue date
Sep 14, 2010
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection based on scatter detection
Patent number
7,551,715
Issue date
Jun 23, 2009
American Science and Engineering, Inc.
Peter Rothschild
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Multiple Image Collection and Synthesis for Personnel Screening
Publication number
20140044238
Publication date
Feb 13, 2014
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Application
Convertible Scan Panel for X-Ray Inspection
Publication number
20130202089
Publication date
Aug 8, 2013
American Science and Engineering, Inc.
Jeffrey Schubert
G01 - MEASURING TESTING
Information
Patent Application
Methods to Perform Backscatter Inspection of Complex Targets in Con...
Publication number
20130101090
Publication date
Apr 25, 2013
American Science and Engineering, Inc.
Jeffrey R. Schubert
G01 - MEASURING TESTING
Information
Patent Application
Multiple Image Collection and Synthesis for Personnel Screening
Publication number
20110164726
Publication date
Jul 7, 2011
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Inspection Based on Scatter Detection
Publication number
20110075808
Publication date
Mar 31, 2011
American Science and Engineering, Inc.
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Application
Multiple Image Collection and Synthesis for Personnel Screening
Publication number
20110017917
Publication date
Jan 27, 2011
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Application
Multiple Image Collection and Synthesis for Personnel Screening
Publication number
20100104069
Publication date
Apr 29, 2010
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Application
Multiple Image Collection and Synthesis for Personnel Screening
Publication number
20090116617
Publication date
May 7, 2009
American Science and Engineering, Inc.
Richard Mastronardi
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Inspection Based on Scatter Detection
Publication number
20070098142
Publication date
May 3, 2007
Peter Rothschild
G01 - MEASURING TESTING
Information
Patent Application
X-ray backscatter inspection with coincident optical beam
Publication number
20060245548
Publication date
Nov 2, 2006
Joseph Callerame
G01 - MEASURING TESTING