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Richard Thorne
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Sherman, TX, US
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last 30 patents
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Patent Grant
Apparatus and method for automatically detecting defects on silicon...
Patent number
6,895,109
Issue date
May 17, 2005
Texas Instruments Incorporated
Floyd Schemmel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for automatically detecting defects on silicon...
Patent number
6,504,948
Issue date
Jan 7, 2003
Texas Instruments Incorporated
Floyd Schemmel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for detecting defective integrated circuit dies in wafer...
Patent number
6,175,646
Issue date
Jan 16, 2001
Texas Instruments Incorporated
Floyd Schemmel
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for detecting defects on silicon dies on a sil...
Patent number
5,943,551
Issue date
Aug 24, 1999
Texas Instruments Incorporated
Floyd Schemmel
G01 - MEASURING TESTING