Richard Timperio

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Catskill, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
X-ray unit technology modules and automated application training
- Patent number 11,988,617
- Issue date May 21, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY UNIT TECHNOLOGY MODULES AND AUTOMATED APPLICATION TRAINING
- Publication number 20220317063
- Publication date Oct 6, 2022
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Application
X-RAY AUTOMATED CALIBRATION AND MONITORING
- Publication number 20220291148
- Publication date Sep 15, 2022
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR WITH SELECTIVE WIDTH REJECTION SYSTEM
- Publication number 20220280981
- Publication date Sep 8, 2022
- John Bean Technologies Corporation
- Richard Timperio
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING