Richard W. Johnson

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Cedar Creek, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Localized heating for defect isolation during die operation
- Patent number 6,873,166
- Issue date Mar 29, 2005
- Advance Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Method of substrate silicon removal for integrated circuit devices
- Patent number 6,635,572
- Issue date Oct 21, 2003
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Localized heating for defect isolation during die operation
- Patent number 6,483,326
- Issue date Nov 19, 2002
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING