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Richard Wallingford
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Forsyth, MO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Semantic image segmentation for semiconductor-based applications
Patent number
12,229,935
Issue date
Feb 18, 2025
KLA Corporation
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Deep learning based defect detection
Patent number
11,776,108
Issue date
Oct 3, 2023
KLA Corp.
Richard Wallingford
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated focusing system for tracking specimen surface with a conf...
Patent number
11,592,653
Issue date
Feb 28, 2023
KLA Corporation
Xiumei Liu
G02 - OPTICS
Information
Patent Grant
System and method for inspection using tensor decomposition and sin...
Patent number
11,431,976
Issue date
Aug 30, 2022
KLA Corporation
Nurmohammed Patwary
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Determining focus settings for specimen scans
Patent number
11,330,164
Issue date
May 10, 2022
KLA Corp.
Bryant Mantiply
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for mixed mode wafer inspection
Patent number
11,295,438
Issue date
Apr 5, 2022
KLA Corporation
Jason Z. Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical-mode selection for multi-mode semiconductor inspection
Patent number
11,010,885
Issue date
May 18, 2021
KLA Corporation
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Active learning for defect classifier training
Patent number
10,713,769
Issue date
Jul 14, 2020
KLA-Tencor Corp.
Jing Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for detecting defects on a wafer
Patent number
10,605,744
Issue date
Mar 31, 2020
KLA-Tencor Corp.
Lu Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for defect detection using image reconstruction
Patent number
10,416,087
Issue date
Sep 17, 2019
KLA-Tencor Corporation
Jing Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data augmentation for convolutional neural network-based defect ins...
Patent number
10,402,688
Issue date
Sep 3, 2019
KLA-Tencor Corporation
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for mixed mode wafer inspection
Patent number
10,192,303
Issue date
Jan 29, 2019
KLA-Tencor Corporation
Jason Z. Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and methods for finding a best aperture and mode to enhan...
Patent number
10,132,760
Issue date
Nov 20, 2018
KLA-Tencor Corporation
Pavel Kolchin
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Systems and methods for detecting defects on a wafer
Patent number
9,880,107
Issue date
Jan 30, 2018
KLA-Tencor Corp.
Lu Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and methods for finding a best aperture and mode to enhan...
Patent number
9,726,617
Issue date
Aug 8, 2017
KLA-Tencor Corporation
Pavel Kolchin
G01 - MEASURING TESTING
Information
Patent Grant
Detecting defects on a wafer
Patent number
8,775,101
Issue date
Jul 8, 2014
KLA-Tencor Corp.
Junqing Huang
G01 - MEASURING TESTING
Information
Patent Grant
Status polling
Patent number
8,645,100
Issue date
Feb 4, 2014
KLA-Tencor Corporation
Krishnamurthy Bhaskar
G05 - CONTROLLING REGULATING
Information
Patent Grant
Semiconductor device property extraction, generation, visualization...
Patent number
8,611,639
Issue date
Dec 17, 2013
KLA-Tencor Technologies Corp.
Ashok Kulkarni
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for detecting defects on a wafer
Patent number
8,467,047
Issue date
Jun 18, 2013
KLA-Tencor Corp.
Lu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for detecting defects on a wafer
Patent number
8,223,327
Issue date
Jul 17, 2012
KLA-Tencor Corp.
Lu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Methods for generating a standard reference die for use in a die to...
Patent number
8,204,296
Issue date
Jun 19, 2012
KLA-Tencor Corp.
Kris Bhaskar
G01 - MEASURING TESTING
Information
Patent Grant
Computer-implemented methods, carrier media, and systems for select...
Patent number
8,049,877
Issue date
Nov 1, 2011
KLA-Tencor Corp.
Richard Wallingford
G01 - MEASURING TESTING
Information
Patent Grant
Computer-implemented methods, carrier media, and systems for determ...
Patent number
8,000,905
Issue date
Aug 16, 2011
KLA-Tencor Technologies Corp.
Stephanie Chen
G01 - MEASURING TESTING
Information
Patent Grant
Methods for identifying array areas in dies formed on a wafer and m...
Patent number
7,925,072
Issue date
Apr 12, 2011
KLA-Tencor Technologies Corp.
Chien-Huei (Adam) Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory load balancing
Patent number
7,865,037
Issue date
Jan 4, 2011
KLA-Tencor Corporation
Krishnamurthy Bhaskar
G01 - MEASURING TESTING
Information
Patent Grant
Methods for generating a standard reference die for use in a die to...
Patent number
7,796,804
Issue date
Sep 14, 2010
KLA-Tencor Corp.
Kris Bhaskar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Mirror node process verification
Patent number
7,602,958
Issue date
Oct 13, 2009
KLA-Tencor Corporation
Krishnamurthy Bhaskar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Daisy chained topology
Patent number
7,555,409
Issue date
Jun 30, 2009
KLA-Tencor Corporation
Krishnamurthy Bhaskar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Programmable image computer
Patent number
7,379,838
Issue date
May 27, 2008
KLA-Tencor Corporation
Krishnamurthy Bhaskar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Full swath analysis
Patent number
7,251,586
Issue date
Jul 31, 2007
KLA-Tencor Technologies Corporation
Krishnamurthy Bhaskar
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
DEEP LEARNING MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS
Publication number
20240095935
Publication date
Mar 21, 2024
KLA Corporation
Hong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automated Focusing System For Tracking Specimen Surface with a Conf...
Publication number
20230204934
Publication date
Jun 29, 2023
KLA Corporation
Xiumei Liu
G02 - OPTICS
Information
Patent Application
SYSTEM AND METHOD FOR OPTICAL WAFER CHARACTERIZATION WITH IMAGE UP...
Publication number
20220383470
Publication date
Dec 1, 2022
Abdurrahman Sezginer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEEP GENERATIVE MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS
Publication number
20220375051
Publication date
Nov 24, 2022
KLA Corporation
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMANTIC IMAGE SEGMENTATION FOR SEMICONDUCTOR-BASED APPLICATIONS
Publication number
20220318986
Publication date
Oct 6, 2022
KLA Corporation
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR MIXED MODE WAFER INSPECTION
Publication number
20220230293
Publication date
Jul 21, 2022
KLA Corporation
Jason Z. Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEEP LEARNING BASED DEFECT DETECTION
Publication number
20220044391
Publication date
Feb 10, 2022
KLA Corporation
Richard Wallingford
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERMINING FOCUS SETTINGS FOR SPECIMEN SCANS
Publication number
20210297600
Publication date
Sep 23, 2021
KLA Corporation
Bryant Mantiply
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Automated Focusing System For Tracking Specimen Surface with a Conf...
Publication number
20200319443
Publication date
Oct 8, 2020
KLA Corporation
Xiumei Liu
G02 - OPTICS
Information
Patent Application
System and Method for Inspection Using Tensor Decomposition and Sin...
Publication number
20200244963
Publication date
Jul 30, 2020
KLA Corporation
Nurmohammed Patwary
G01 - MEASURING TESTING
Information
Patent Application
Optical-Mode Selection for Multi-Mode Semiconductor Inspection
Publication number
20200193588
Publication date
Jun 18, 2020
KLA-Tencor Corporation
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING
Publication number
20190370955
Publication date
Dec 5, 2019
KLA-Tencor Corporation
Jing Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and System for Mixed Mode Wafer Inspection
Publication number
20190108630
Publication date
Apr 11, 2019
KLA-Tencor Corporation
Jason Z. Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER
Publication number
20180202943
Publication date
Jul 19, 2018
KLA-Tencor Corporation
Lu Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Data Augmentation for Convolutional Neural Network-Based Defect Ins...
Publication number
20180157933
Publication date
Jun 7, 2018
KLA-Tencor Corporation
Bjorn Brauer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHODS FOR FINDING A BEST APERTURE AND MODE TO ENHAN...
Publication number
20170307545
Publication date
Oct 26, 2017
KLA-Tencor Corporation
Pavel Kolchin
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Defect Detection Using Image Reconstruction
Publication number
20170191945
Publication date
Jul 6, 2017
KLA-Tencor Corporation
Jing Zhang
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR FINDING A BEST APERTURE AND MODE TO ENHAN...
Publication number
20140354983
Publication date
Dec 4, 2014
KLA-Tencor Corporation
Pavel Kolchin
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Mixed Mode Wafer Inspection
Publication number
20140153814
Publication date
Jun 5, 2014
KLA-Tencor Corporation
Jason Z. Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and Methods for Detecting Defects on a Wafer
Publication number
20130250287
Publication date
Sep 26, 2013
KLA-Tencor Corporation
Lu Chen
G01 - MEASURING TESTING
Information
Patent Application
DETECTING DEFECTS ON A WAFER
Publication number
20130035876
Publication date
Feb 7, 2013
KLA-Tencor Corporation
Junqing Huang
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Detecting Defects on a Wafer
Publication number
20120268735
Publication date
Oct 25, 2012
KLA-Tencor Corporation
Lu Chen
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...
Publication number
20100329540
Publication date
Dec 30, 2010
KLA-Tencor Corporation
Kris Bhaskar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER
Publication number
20100188657
Publication date
Jul 29, 2010
KLA-Tencor Corporation
Lu Chen
G01 - MEASURING TESTING
Information
Patent Application
COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR SELECT...
Publication number
20090284733
Publication date
Nov 19, 2009
Richard Wallingford
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...
Publication number
20090041332
Publication date
Feb 12, 2009
KLA-Tencor Corporation
Kris Bhaskar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...
Publication number
20090037134
Publication date
Feb 5, 2009
Ashok Kulkarni
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR IDENTIFYING ARRAY AREAS IN DIES FORMED ON A WAFER AND M...
Publication number
20080219545
Publication date
Sep 11, 2008
Chien-Huei Adam Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Status Polling
Publication number
20070124095
Publication date
May 31, 2007
KLA-Tencor Technologies Corporation
Krishnamurthy Bhaskar
G05 - CONTROLLING REGULATING
Information
Patent Application
Programmable Image Computer
Publication number
20070005284
Publication date
Jan 4, 2007
KLA-Tencor Technologies Corporation
Krishnamurthy Bhaskar
G06 - COMPUTING CALCULATING COUNTING