Richard Wunderlich

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for implementing a scalable digital infrastruc...
- Patent number 12,332,306
- Issue date Jun 17, 2025
- TOKYO ELECTRON U.S. HOLDINGS, INC.
- Richard Wunderlich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing all test circuits on a wafer from...
- Patent number 12,153,087
- Issue date Nov 26, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for managing power of test circuits
- Patent number 12,007,429
- Issue date Jun 11, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Integrated device comprising device level cells with variable sizes...
- Patent number 10,141,297
- Issue date Nov 27, 2018
- QUALCOMM Incorporated
- Palkesh Jain
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR TESTING ALL TEST CIRCUITS ON A WAFER FROM...
- Publication number 20220413040
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Patrick G. DRENNAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IMPLEMENTING A SCALABLE DIGITAL INFRASTRUC...
- Publication number 20220413045
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Richard WUNDERLICH
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SETTING A PRECISE VOLTAGE ON TEST CIRCUITS
- Publication number 20220415727
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Joseph S. SPECTOR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MANAGING POWER OF TEST CIRCUITS
- Publication number 20220413037
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Patrick G. DRENNAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROBING MULTIPLE TEST CIRCUITS IN WAFER SC...
- Publication number 20220415728
- Publication date Dec 29, 2022
- IC ANALYTICA, LLC
- Patrick G. DRENNAN
- H01 - BASIC ELECTRIC ELEMENTS