New Orleans, LA, US
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Patent Grant
Yokogawa Fluence Analytics, Inc.
Wayne Frederick Reed
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.
Wayne Frederick Reed
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.
Wayne Frederick REED
G01 - MEASURING TESTING
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Patent Application
ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.
Wayne Frederick REED
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
