Rick Lai

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Taichung City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Lithographic plane check for mask processing
- Patent number 9,671,685
- Issue date Jun 6, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-Hsiang Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Rendered database image-to-inspection image optimization for inspec...
- Patent number 8,818,072
- Issue date Aug 26, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cost-effective method for extreme ultraviolet (EUV) mask production
- Patent number 8,592,102
- Issue date Nov 26, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-Hsiang Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
RENDERED DATABASE IMAGE-TO-INSPECTION IMAGE OPTIMIZATION FOR INSPEC...
- Publication number 20120051621
- Publication date Mar 1, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Biow-Hiem Ong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHIC PLANE CHECK FOR MASK PROCESSING
- Publication number 20110161893
- Publication date Jun 30, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- CHIN-HSIANG LIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COST-EFFECTIVE METHOD FOR EXTREME ULTRAVIOLET (EUV) MASK PRODUCTION
- Publication number 20110159410
- Publication date Jun 30, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-Hsiang Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY