Ricky Hsu

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Hsinchu Hsien, TW

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring displacement, surface profile an...
- Patent number 7,663,767
- Issue date Feb 16, 2010
- Industrial Technology Research Institute
- Hong-Xi Cao
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring displacement, surface profile an...
- Patent number 7,567,350
- Issue date Jul 28, 2009
- Industrial Technology Research Institute
- Hong-Xi Cao
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus as tuning filter
- Patent number 7,460,568
- Issue date Dec 2, 2008
- Industrial Technology Research Institute
- Jen-Chuen Liao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING DISPLACEMENT, SURFACE PROFILE AN...
- Publication number 20080316502
- Publication date Dec 25, 2008
- Industrial Technology Research Institute
- Hong-Xi Cao
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring displacement, surface profile an...
- Publication number 20060268286
- Publication date Nov 30, 2006
- Hong-Xi Cao
- G01 - MEASURING TESTING
Information Patent Application
Apparatus as tuning filter
- Publication number 20060140229
- Publication date Jun 29, 2006
- Jen-Chuen Liao
- G02 - OPTICS
Information Patent Application
Wavelength meter
- Publication number 20050195401
- Publication date Sep 8, 2005
- Hong-Xi Cao
- G01 - MEASURING TESTING