Ricky W. Ho

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for facilitating scan testing of asynchronous logic circu...
- Patent number 5,285,153
- Issue date Feb 8, 1994
- Altera Corporation
- Bahram Ahanin
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for facilitating scan testing of asynchronous...
- Patent number 5,166,604
- Issue date Nov 24, 1992
- Altera Corporation
- Bahram Ahanin
- G01 - MEASURING TESTING