RIGALANTU JI

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CHANGCHUN, CN

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Patents Grantslast 30 patents

Information Patent Grant
Heterodyne two-dimensional grating measuring device and measuring m...
- Patent number 12,188,793
- Issue date Jan 7, 2025
- CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, ACADEMY OF SCIENCES
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne one-dimensional grating measuring device and measuring m...
- Patent number 11,860,057
- Issue date Jan 2, 2024
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HETERODYNE TWO-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING M...
- Publication number 20220228890
- Publication date Jul 21, 2022
- CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, ACADEMY OF SCIENCES
- WENHAO LI
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE ONE-DIMENSIONAL GRATING MEASURING DEVICE AND MEASURING M...
- Publication number 20220221372
- Publication date Jul 14, 2022
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- WENHAO LI
- G01 - MEASURING TESTING