Riitta Kaijansaari

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Helsinki, FI

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Patents Grantslast 30 patents

Information Patent Grant
Measurement arrangement for X-ray fluoresence analysis
- Patent number 7,065,174
- Issue date Jun 20, 2006
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement arrangement for X-ray fluoresence analysis
- Publication number 20050129174
- Publication date Jun 16, 2005
- Heikki Sipila
- G01 - MEASURING TESTING