Riku Tamura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer and method of controlling the same
- Patent number 12,033,842
- Issue date Jul 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Yasuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen analyzer
- Patent number 12,025,626
- Issue date Jul 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Riku Tamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER
- Publication number 20240339312
- Publication date Oct 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Tsugunao TOMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME
- Publication number 20240177983
- Publication date May 30, 2024
- HITACHI HIGH-TECH COORPORATION
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME
- Publication number 20240063010
- Publication date Feb 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuka SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Controlling Mass Spectrometer
- Publication number 20240006174
- Publication date Jan 4, 2024
- Hitachi High-Tech Corporation
- Riku TAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20230136178
- Publication date May 4, 2023
- Hitachi High-Tech Corporation
- Yuka SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN ANALYZER
- Publication number 20220283193
- Publication date Sep 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Riku Tamura
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND METHOD OF CONTROLLING THE SAME
- Publication number 20220270868
- Publication date Aug 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Yasuda
- G01 - MEASURING TESTING

Riku Tamura

Person

Patents Grantslast 30 patents

Mass spectrometer and method of controlling the same

Specimen analyzer

Patents Applicationslast 30 patents

METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER

MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME

MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME

Method for Controlling Mass Spectrometer

Mass Spectrometer

SPECIMEN ANALYZER

MASS SPECTROMETER AND METHOD OF CONTROLLING THE SAME