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Rinatya Levy
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Hertzelia, IL
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last 30 patents
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Patent Grant
On-die capacitance measurement module and method for measuring an o...
Patent number
9,459,297
Issue date
Oct 4, 2016
FREESCALE SEMICONDUCTOR, INC.
Ezra Baruch
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
ON-DIE CAPACITANCE MEASUREMENT MODULE AND METHOD FOR MEASURING AN O...
Publication number
20140333327
Publication date
Nov 13, 2014
FREESCALE SEMICONDUCTOR, INC.
Ezra Baruch
G01 - MEASURING TESTING