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Rintaro Nakatani

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  • Chiba, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray analyzer and X-ray analysis method
    • Patent number 8,891,729
    • Issue date Nov 18, 2014
    • SII NanoTechnology Inc.
    • Yoshiki Matoba
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal analysis equipment
    • Patent number 7,748,894
    • Issue date Jul 6, 2010
    • SII NanoTechnology Inc.
    • Rintaro Nakatani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal analysis apparatus
    • Patent number 7,744,273
    • Issue date Jun 29, 2010
    • SII NanoTechnology Inc.
    • Kanji Nagasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal analysis system and method of drying the same
    • Patent number 7,641,384
    • Issue date Jan 5, 2010
    • SII NanoTechnology Inc.
    • Rintaro Nakatani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Differential scanning calorimeter with a second heater
    • Patent number 7,275,862
    • Issue date Oct 2, 2007
    • SII NanoTechnology Inc.
    • Shinya Nishimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Derived data display adjustment system
    • Patent number 6,911,979
    • Issue date Jun 28, 2005
    • SII NanoTechnology Inc.
    • Rintaro Nakatani
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Thermogravimetry apparatus
    • Patent number 6,709,153
    • Issue date Mar 23, 2004
    • SII NanoTechnology Inc.
    • Rintaro Nakatani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal analyzer
    • Patent number 6,542,084
    • Issue date Apr 1, 2003
    • Seiko Instruments Inc.
    • Rintaro Nakatani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal analysis apparatus
    • Patent number 6,402,370
    • Issue date Jun 11, 2002
    • Seiko Instruments Inc.
    • Rintaro Nakatani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Differential thermal analyzer
    • Patent number 6,146,012
    • Issue date Nov 14, 2000
    • Seiko Instruments Inc.
    • Nobutaka Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Apparatus for thermal analysis
    • Patent number 5,448,504
    • Issue date Sep 5, 1995
    • Seiko Instruments Inc.
    • Rintaro Nakatani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Waveform display device
    • Patent number 5,379,239
    • Issue date Jan 3, 1995
    • Seiko Instruments Inc.
    • Rintaro Nakatani
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Graph display device
    • Patent number 5,309,171
    • Issue date May 3, 1994
    • Seiko Instruments Inc.
    • Rintaro Nakatani
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Heat analyzer
    • Patent number 5,228,778
    • Issue date Jul 20, 1993
    • Seiko Instruments Inc.
    • Rintaro Nakatani
    • G01 - MEASURING TESTING