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Ritsuko Kurazono
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Osaka, JP
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last 30 patents
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Patent Grant
Electromagnetic disturbance analysis method and apparatus and semic...
Patent number
6,810,340
Issue date
Oct 26, 2004
Matsushita Electric Industrial Co., Ltd.
Kenji Shimazaki
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Electromagnetic disturbance analysis method and apparatus and semic...
Publication number
20020147553
Publication date
Oct 10, 2002
Kenji Shimazaki
G01 - MEASURING TESTING