Ritsuo Fukaya

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 8,969,801
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,907,267
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 8,835,844
- Issue date Sep 16, 2014
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope optical condition setting method and s...
- Patent number 8,692,197
- Issue date Apr 8, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling charging of sample and scanning electron mic...
- Patent number 8,487,251
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic charge measurement method, focus adjustment method, a...
- Patent number 8,178,836
- Issue date May 15, 2012
- Hitachi High-Technologies Corporation
- Tatsuaki Ishijima
- G01 - MEASURING TESTING
Information Patent Grant
Sample dimension measuring method and scanning electron microscope
- Patent number 8,080,789
- Issue date Dec 20, 2011
- Hitachi, Ltd.
- Osamu Nasu
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam irradiation system
- Patent number 7,851,756
- Issue date Dec 14, 2010
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic charge measurement method, focus adjustment method, a...
- Patent number 7,745,782
- Issue date Jun 29, 2010
- Hitachi High-Technologies Corporation
- Tatsuaki Ishijima
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,700,918
- Issue date Apr 20, 2010
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring dimensions of sample and scanning electron mic...
- Patent number 7,659,508
- Issue date Feb 9, 2010
- Hitachi, Ltd.
- Osamu Nasu
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,566,872
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,372,028
- Issue date May 13, 2008
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,087,899
- Issue date Aug 8, 2006
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 6,946,656
- Issue date Sep 20, 2005
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal display device utilizing in-plane-switching system a...
- Patent number 6,300,995
- Issue date Oct 9, 2001
- Hitachi, Ltd.
- Masatoshi Wakagi
- G02 - OPTICS
Information Patent Grant
Active matrix liquid crystal display
- Patent number 6,184,946
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Masahiko Ando
- G02 - OPTICS
Information Patent Grant
Liquid crystal display device in-plane-switching system with counte...
- Patent number 5,995,187
- Issue date Nov 30, 1999
- Hitachi, Ltd.
- Masatoshi Wakagi
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20140299769
- Publication date Oct 9, 2014
- Hitachi High-Technologies Corporation
- Nobuhiro Okai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20140217274
- Publication date Aug 7, 2014
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope Optical Condition Setting Method and S...
- Publication number 20120318977
- Publication date Dec 20, 2012
- Hitachi High-Technologies Corporation
- Zhigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device
- Publication number 20120126119
- Publication date May 24, 2012
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING CHARGING OF SAMPLE AND SCANNING ELECTRON MIC...
- Publication number 20110139981
- Publication date Jun 16, 2011
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Irradiation System
- Publication number 20110073760
- Publication date Mar 31, 2011
- Hitachi High-Technologies Corporation
- Ritsuo FUKAYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Electrification Measurement Method and Charged Particle Beam...
- Publication number 20100294929
- Publication date Nov 25, 2010
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic Charge Measurement Method, Focus Adjustment Method, a...
- Publication number 20100237241
- Publication date Sep 23, 2010
- Hitachi High-Technologies Corporation
- Tatsuaki ISHIJIMA
- G01 - MEASURING TESTING
Information Patent Application
Sample dimension measuring method and scanning electron microscope
- Publication number 20100038535
- Publication date Feb 18, 2010
- Osamu Nasu
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Irradiation System
- Publication number 20090032723
- Publication date Feb 5, 2009
- Hitachi High-Technologies Corporation
- Ritsuo FUKAYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Charge Measurement Method, Focus Adjustment Method, A...
- Publication number 20080203298
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Tatsuaki ISHIJIMA
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20080201091
- Publication date Aug 21, 2008
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20070045539
- Publication date Mar 1, 2007
- Ritsuo Fukaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20060219918
- Publication date Oct 5, 2006
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20050161600
- Publication date Jul 28, 2005
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20040211899
- Publication date Oct 28, 2004
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring dimensions of sample and scanning electron mic...
- Publication number 20040051040
- Publication date Mar 18, 2004
- Osamu Nasu
- G01 - MEASURING TESTING

Ritsuo Fukaya

Person

Patents Grantslast 30 patents

Scanning electron microscope

Charged particle beam device

Sample electrification measurement method and charged particle beam...

Scanning electron microscope optical condition setting method and s...

Method for controlling charging of sample and scanning electron mic...

Electrostatic charge measurement method, focus adjustment method, a...

Sample dimension measuring method and scanning electron microscope

Charged particle beam irradiation system

Electrostatic charge measurement method, focus adjustment method, a...

Sample electrification measurement method and charged particle beam...

Method for measuring dimensions of sample and scanning electron mic...

Scanning electron microscope

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Liquid crystal display device utilizing in-plane-switching system a...

Active matrix liquid crystal display

Liquid crystal display device in-plane-switching system with counte...

Patents Applicationslast 30 patents

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM DEVICE

Scanning Electron Microscope Optical Condition Setting Method and S...

Charged-Particle-Beam Device

METHOD FOR CONTROLLING CHARGING OF SAMPLE AND SCANNING ELECTRON MIC...

Charged Particle Beam Irradiation System

Sample Electrification Measurement Method and Charged Particle Beam...

Electrostatic Charge Measurement Method, Focus Adjustment Method, a...

Sample dimension measuring method and scanning electron microscope

Charged Particle Beam Irradiation System

Electrostatic Charge Measurement Method, Focus Adjustment Method, A...

Sample electrification measurement method and charged particle beam...

Scanning electron microscope

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Method for measuring dimensions of sample and scanning electron mic...