Ritsuro Orihashi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Output buffer circuit and differential output buffer circuit, and t...
- Patent number 8,324,925
- Issue date Dec 4, 2012
- Hitachi, Ltd.
- Satoshi Muraoka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Detection circuit and foreign matter inspection apparatus for semic...
- Patent number 7,990,529
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Output buffer circuit and differential output buffer circuit, and t...
- Patent number 7,969,197
- Issue date Jun 28, 2011
- Hitachi, Ltd.
- Satoshi Muraoka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for mass spectrometry
- Patent number 7,928,365
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system
- Patent number 7,890,074
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Kenichi Shinbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method of magnetic disk or magn...
- Patent number 7,817,362
- Issue date Oct 19, 2010
- Hitachi, Ltd.
- Masayoshi Takahashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Output buffer circuit and differential output buffer circuit, and t...
- Patent number 7,692,445
- Issue date Apr 6, 2010
- Hitachi, Ltd.
- Satoshi Muraoka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device, testing and manufacturing methods thereof
- Patent number 7,668,027
- Issue date Feb 23, 2010
- Renesas Technology Corp.
- Kengo Imagawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and its apparatus for mass spectrometry
- Patent number 7,476,850
- Issue date Jan 13, 2009
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and testing method thereof
- Patent number 7,474,290
- Issue date Jan 6, 2009
- Renesas Technology Corp.
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Semiconductor device and the method of testing the same
- Patent number 7,443,373
- Issue date Oct 28, 2008
- Renesas Technology Corp.
- Kengo Imagawa
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Semiconductor device and testing method of semiconductor device
- Patent number 7,358,953
- Issue date Apr 15, 2008
- Renesas Technology Corp.
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Magnetic characteristic inspecting apparatus and inspecting method...
- Patent number 7,276,900
- Issue date Oct 2, 2007
- Hitachi High-Technologies Corporation
- Masayoshi Takahashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus
- Patent number 6,768,953
- Issue date Jul 27, 2004
- Hitachi, Ltd.
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 6,697,755
- Issue date Feb 24, 2004
- Hitachi, Ltd.
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device structure
- Patent number 5,811,877
- Issue date Sep 22, 1998
- Hitachi, Ltd.
- Ichiro Miyano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital circuitry apparatus
- Patent number 5,438,259
- Issue date Aug 1, 1995
- Hitachi, Ltd.
- Ritsuro Orihashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital circuitry apparatus
- Patent number 5,406,198
- Issue date Apr 11, 1995
- Hitachi, Ltd.
- Ritsuro Orihashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time interval measurement apparatus
- Patent number 4,855,970
- Issue date Aug 8, 1989
- Hitachi, Ltd.
- Yoshihiko Hayashi
- G04 - HOROLOGY
Information Patent Grant
Wave formatter for a logic circuit testing system
- Patent number 4,755,758
- Issue date Jul 5, 1988
- Hitachi, Ltd.
- Ritsuro Orihashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OUTPUT BUFFER CIRCUIT AND DIFFERENTIAL OUTPUT BUFFER CIRCUIT, AND T...
- Publication number 20110215830
- Publication date Sep 8, 2011
- SATOSHI MURAOKA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR MASS SPECTROMETRY
- Publication number 20110192970
- Publication date Aug 11, 2011
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OUTPUT BUFFER CIRCUIT AND DIFFERENTIAL OUTPUT BUFFER CIRCUIT, AND T...
- Publication number 20100219856
- Publication date Sep 2, 2010
- SATOSHI MURAOKA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETECTION CIRCUIT AND FOREIGN MATTER INSPECTION APPARATUS FOR SEMIC...
- Publication number 20090122305
- Publication date May 14, 2009
- Masami MAKUUCHI
- G01 - MEASURING TESTING
Information Patent Application
Output Buffer Circuit and Differential Output Buffer Circuit, and T...
- Publication number 20080265944
- Publication date Oct 30, 2008
- SATOSHI MURAOKA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DATA ACQUISITION SYSTEM
- Publication number 20080073504
- Publication date Mar 27, 2008
- Kenichi Shinbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device, testing and manufacturing methods thereof
- Publication number 20070047345
- Publication date Mar 1, 2007
- Kengo Imagawa
- G11 - INFORMATION STORAGE
Information Patent Application
Method and its apparatus for mass spectrometry
- Publication number 20060289739
- Publication date Dec 28, 2006
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for mass spectrometry
- Publication number 20060248942
- Publication date Nov 9, 2006
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Magnetic characteristic inspecting apparatus and inspecting method...
- Publication number 20060132122
- Publication date Jun 22, 2006
- Masayoshi Takahashi
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and testing method thereof
- Publication number 20050122300
- Publication date Jun 9, 2005
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Semiconductor device and the method of testing the same
- Publication number 20050122297
- Publication date Jun 9, 2005
- Kengo Imagawa
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Semiconductor device and testing method of semiconductor device
- Publication number 20040189564
- Publication date Sep 30, 2004
- Masami Makuuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Inspection apparatus and inspection method of magnetic disk or magn...
- Publication number 20040078703
- Publication date Apr 22, 2004
- Masayoshi Takahashi
- G11 - INFORMATION STORAGE
Information Patent Application
Test apparatus
- Publication number 20030167145
- Publication date Sep 4, 2003
- Hitachi, Ltd
- Fujio Oonishi
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus
- Publication number 20030040874
- Publication date Feb 27, 2003
- HITACHI, LTD.
- Fujio Oonishi
- G01 - MEASURING TESTING

Ritsuro Orihashi

Person

Patents Grantslast 30 patents

Output buffer circuit and differential output buffer circuit, and t...

Detection circuit and foreign matter inspection apparatus for semic...

Output buffer circuit and differential output buffer circuit, and t...

Method and apparatus for mass spectrometry

Data acquisition system

Inspection apparatus and inspection method of magnetic disk or magn...

Output buffer circuit and differential output buffer circuit, and t...

Semiconductor device, testing and manufacturing methods thereof

Method and its apparatus for mass spectrometry

Semiconductor device and testing method thereof

Semiconductor device and the method of testing the same

Semiconductor device and testing method of semiconductor device

Magnetic characteristic inspecting apparatus and inspecting method...

Test apparatus

Test apparatus

Semiconductor device structure

Digital circuitry apparatus

Digital circuitry apparatus

Time interval measurement apparatus

Wave formatter for a logic circuit testing system

Patents Applicationslast 30 patents

OUTPUT BUFFER CIRCUIT AND DIFFERENTIAL OUTPUT BUFFER CIRCUIT, AND T...

METHOD AND APPARATUS FOR MASS SPECTROMETRY

OUTPUT BUFFER CIRCUIT AND DIFFERENTIAL OUTPUT BUFFER CIRCUIT, AND T...

DETECTION CIRCUIT AND FOREIGN MATTER INSPECTION APPARATUS FOR SEMIC...

Output Buffer Circuit and Differential Output Buffer Circuit, and T...

DATA ACQUISITION SYSTEM

Semiconductor device, testing and manufacturing methods thereof

Method and its apparatus for mass spectrometry

Method and apparatus for mass spectrometry

Magnetic characteristic inspecting apparatus and inspecting method...

Semiconductor device and testing method thereof

Semiconductor device and the method of testing the same

Semiconductor device and testing method of semiconductor device

Inspection apparatus and inspection method of magnetic disk or magn...

Test apparatus

Test apparatus