Ritsurou Orihashi

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Contamination-inspecting apparatus and detection circuit
- Patent number 8,035,071
- Issue date Oct 11, 2011
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Pulse generation circuit and semiconductor tester that uses the pul...
- Patent number 7,085,982
- Issue date Aug 1, 2006
- Hitachi, Ltd.
- Kenichi Shinbo
- G01 - MEASURING TESTING
Information Patent Grant
TESTING APPARATUS FOR CONDUCTING A TEST ON A MAGNETIC RECORDING MED...
- Patent number 6,894,489
- Issue date May 17, 2005
- Hitachi, Ltd.
- Masami Makuuchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing apparatus of magnetic recording medium or magnetic head inc...
- Patent number 6,700,369
- Issue date Mar 2, 2004
- Hitachi, Ltd.
- Masami Makuuchi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CONTAMINATION-INSPECTING APPARATUS AND DETECTION CIRCUIT
- Publication number 20080278717
- Publication date Nov 13, 2008
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus of magnetic recording medium or magnetic head
- Publication number 20040124832
- Publication date Jul 1, 2004
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
Pulse generation circuit and semiconductor tester that uses the pul...
- Publication number 20030140286
- Publication date Jul 24, 2003
- Kenichi Shinbo
- H03 - BASIC ELECTRONIC CIRCUITRY