Robert A. Brooks

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Rye, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for discriminating defects in top and bottom surfaces of...
- Patent number 5,473,247
- Issue date Dec 5, 1995
- Magnetic Analysis Corporation
- Zhongging You
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for flaw detection using an AC saturating fiel...
- Patent number 5,418,459
- Issue date May 23, 1995
- Magnetic Analysis Corporation
- Zhongqing You
- G01 - MEASURING TESTING
Information Patent Grant
Transducers and method for making same
- Patent number 4,864,234
- Issue date Sep 5, 1989
- Magnetic Analysis Corporation
- Robert A. Brooks
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic and ultrasonic objects testing apparatus
- Patent number 4,449,411
- Issue date May 22, 1984
- Magnetic Analysis Corporation
- Peter J. Suhr
- G01 - MEASURING TESTING
Information Patent Grant
EMAT Test apparatus having retractable probe
- Patent number 4,449,408
- Issue date May 22, 1984
- Magnetic Analysis Corporation
- Robert A. Brooks
- G01 - MEASURING TESTING
Information Patent Grant
Pulse eddy current testing apparatus for magnetic materials, partic...
- Patent number 4,188,577
- Issue date Feb 12, 1980
- Magnetic Analysis Corporation
- Girish P. Mhatre
- G01 - MEASURING TESTING