Robert A. Comstock

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring changes in photomask defectivity
- Patent number 9,892,503
- Issue date Feb 13, 2018
- KLA-Tencor Corporation
- Chun Guan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring changes in photomask defectivity
- Patent number 9,518,935
- Issue date Dec 13, 2016
- KLA-Tencor Corporation
- Chun Guan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MONITORING CHANGES IN PHOTOMASK DEFECTIVITY
- Publication number 20170053395
- Publication date Feb 23, 2017
- KLA-Tencor Corporation
- Chun Guan
- G01 - MEASURING TESTING
Information Patent Application
MONITORING CHANGES IN PHOTOMASK DEFECTIVITY
- Publication number 20150029498
- Publication date Jan 29, 2015
- KLA-Tencor Corporation
- Chun Guan
- G01 - MEASURING TESTING