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Robert A. Gasser
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Tigard, OR, US
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last 30 patents
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Patent Grant
Guard wall to reduce delamination effects within a semiconductor die
Patent number
5,986,315
Issue date
Nov 16, 1999
Intel Corporation
Melton C. Bost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Single poly devices for monitoring the level and polarity of proces...
Patent number
5,844,300
Issue date
Dec 1, 1998
Intel Corporation
Mohsen Alavi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a guard wall to reduce delamination effects
Patent number
5,270,256
Issue date
Dec 14, 1993
Intel Corporation
Melton C. Bost
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MOS rear end processing
Patent number
4,620,986
Issue date
Nov 4, 1986
Intel Corporation
Leopoldo D. Yau
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MOS rear end processing
Patent number
4,587,138
Issue date
May 6, 1986
Intel Corporation
Leopoldo D. Yau
H01 - BASIC ELECTRIC ELEMENTS