Robert A. Weller

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Brentwood, TN, US

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Patents Grantslast 30 patents

Information Patent Grant
Inclusion of nitrogen at the silicon dioxide-silicon carbide interf...
- Patent number 7,727,340
- Issue date Jun 1, 2010
- Vanderbilt University
- Gilyong Y. Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inclusion of nitrogen at the silicon dioxide-silicon carbide interf...
- Patent number 7,235,438
- Issue date Jun 26, 2007
- Vanderbilt University
- Gilyong Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inclusion of nitrogen at the silicon dioxide-silicon carbide intera...
- Patent number 6,939,756
- Issue date Sep 6, 2005
- Vanderbilt University
- Gilyong Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-induced electron emission microscopy
- Patent number 6,291,823
- Issue date Sep 18, 2001
- Sandia Corporation
- Barney L. Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for time of flight medium energy particle scat...
- Patent number 5,026,988
- Issue date Jun 25, 1991
- Vanderbilt University
- Marcus H. Mendenhall
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Inclusion of nitrogen at the silicon dioxide-silicon carbide interf...
- Publication number 20080128709
- Publication date Jun 5, 2008
- Vanderbilt University
- Gilyong Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inclusion of nitrogen at the silicon dioxide-silicon carbide interf...
- Publication number 20060024978
- Publication date Feb 2, 2006
- Vanderbilt University
- Gilyong Y. Chung
- H01 - BASIC ELECTRIC ELEMENTS