Robert Alan Hoult

Person

Buchs, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Diffuse reflectance infrared fourier transform spectroscopy
- Patent number 11,156,549
- Issue date Oct 26, 2021
- PERKINELMER SINGAPORE PTE LIMITED
- Ralph Lance Carter
- G01 - MEASURING TESTING
Information Patent Grant
Identifying presence of substrates
- Patent number 10,578,550
- Issue date Mar 3, 2020
- PERKINELMER SINGAPORE PTE LIMITED
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Diffuse reflectance infrared Fourier transform spectroscopy
- Patent number 10,473,584
- Issue date Nov 12, 2019
- PERKINELMER SINGAPORE PTE LIMITED
- Ralph Lance Carter
- G01 - MEASURING TESTING
Information Patent Grant
Identifying presence of substances
- Patent number 10,337,990
- Issue date Jul 2, 2019
- PERKINELMER SINGAPORE PTE LIMITED
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Diffuse reflectance infrared Fourier transform spectroscopy
- Patent number 9,976,949
- Issue date May 22, 2018
- PERKINELMER SINGAPORE PTE LIMITED
- Ralph Lance Carter
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic instrument
- Patent number 9,322,703
- Issue date Apr 26, 2016
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic instruments and foot portions for spectroscopic instr...
- Patent number 9,250,127
- Issue date Feb 2, 2016
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Differential scanning calorimetry and calibration methods for use t...
- Patent number 9,213,008
- Issue date Dec 15, 2015
- PERKINELMER SINGAPORE PTE LIMITED
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for attenuated total internal reflectance (ATR)...
- Patent number 8,743,456
- Issue date Jun 3, 2014
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Grant
Accessory for attenuated total internal reflectance (ATR) spectroscopy
- Patent number 8,400,711
- Issue date Mar 19, 2013
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Accessory for attenuated total internal reflectance (ATR) spectroscopy
- Patent number 8,355,202
- Issue date Jan 15, 2013
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
Information Patent Grant
Measurement of sample reflectance
- Patent number 8,345,235
- Issue date Jan 1, 2013
- PerkinElmer Health Sciences, Inc.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Relating to scanning confocal microscopy
- Patent number 8,284,484
- Issue date Oct 9, 2012
- PerkinElmer Singapore PTE, Ltd.
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Grant
Accessory for attenuated total internal reflective (ATR) spectroscopy
- Patent number 8,223,429
- Issue date Jul 17, 2012
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Accessory for attenuated total internal reflectance (ATR) spectroscopy
- Patent number 8,223,430
- Issue date Jul 17, 2012
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Processing data from a CCD and CCD imaging apparatus to correct sme...
- Patent number 8,169,515
- Issue date May 1, 2012
- PerkinElmer Singapore PTE. LTD.
- Antonio Canas Wilkinson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Accessory for attenuated total internal reflectance (ATR) spectroscopy
- Patent number 7,935,929
- Issue date May 3, 2011
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of sample reflectance
- Patent number 7,595,884
- Issue date Sep 29, 2009
- PerkinElmer LAS, Inc.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Detector array and cross-talk linearity connection
- Patent number 7,560,697
- Issue date Jul 14, 2009
- PerkinElmer Singapore PTE. LTD.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing a dynamic sample
- Patent number 7,521,696
- Issue date Apr 21, 2009
- PerkinElmer Singapore PTE. LTD.
- Patrick Courtney
- G01 - MEASURING TESTING
Information Patent Grant
Small detector array for infrared imaging microscope
- Patent number 7,378,657
- Issue date May 27, 2008
- PerkinElmer International C.V.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Scanning IR microscope
- Patent number 7,057,733
- Issue date Jun 6, 2006
- Singapore Pte. Ltd.
- Ralph Lance Carter
- G01 - MEASURING TESTING
Information Patent Grant
Suppression of undesired components in the measured spectra of spec...
- Patent number 6,610,982
- Issue date Aug 26, 2003
- PerkinElmer Instruments LLC
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Suppression of undesired components in the measured spectra of spec...
- Patent number 6,518,573
- Issue date Feb 11, 2003
- Wellesley International C.V.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Grant
Reflectance sampler and method of use
- Patent number 6,121,052
- Issue date Sep 19, 2000
- PerkinElmer International C.V.
- Robert A. Hoult
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Mounting of optical components
- Patent number 6,091,554
- Issue date Jul 18, 2000
- PerkinElmer International C.V.
- Douglas W. Sharp
- G02 - OPTICS
Information Patent Grant
Standardizing a spectrometric instrument
- Patent number 6,049,762
- Issue date Apr 11, 2000
- Perkin Elmer LLC
- Alan M. Ganz
- G01 - MEASURING TESTING
Information Patent Grant
Probe for spectroscopic analysis
- Patent number 5,974,210
- Issue date Oct 26, 1999
- Perkin-Elmer Ltd.
- Ian Alcock
- G01 - MEASURING TESTING
Information Patent Grant
Digitisation of interferograms in Fourier transform spectroscopy
- Patent number 5,914,780
- Issue date Jun 22, 1999
- Perkin-Elmer Ltd.
- Andrew Turner
- G01 - MEASURING TESTING
Information Patent Grant
Carrier and its use in the preparation of samples for spectroscopy
- Patent number 5,877,435
- Issue date Mar 2, 1999
- Perkin-Elmer Ltd.
- Robert A. Hoult
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY
- Publication number 20200103338
- Publication date Apr 2, 2020
- PERKINELMER SINGAPORE PTE LIMITED
- Ralph Lance Carter
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING PRESENCE OF SUBSTANCES
- Publication number 20190265161
- Publication date Aug 29, 2019
- PERKINELMER SINGAPORE PTE LIMITED
- Robert Alan HOULT
- G01 - MEASURING TESTING
Information Patent Application
DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY
- Publication number 20180266942
- Publication date Sep 20, 2018
- PerkinElmer Singapore Pte. Ltd.
- Ralph Lance Carter
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFYING PRESENCE OF SUBSTANCES
- Publication number 20160209324
- Publication date Jul 21, 2016
- PERKINELMER SINGAPORE PTE LIMITED
- Robert Alan HOULT
- G01 - MEASURING TESTING
Information Patent Application
DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY
- Publication number 20160178509
- Publication date Jun 23, 2016
- PERKINELMER SINGAPORE PTE LIMITED
- Ralph Lance CARTER
- G01 - MEASURING TESTING
Information Patent Application
DIAMOND ATR ARTEFACT CORRECTION
- Publication number 20150177142
- Publication date Jun 25, 2015
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC INSTRUMENTS AND FOOT PORTIONS FOR SPECTROSCOPIC INSTR...
- Publication number 20140125974
- Publication date May 8, 2014
- PerkinElmer Singapore Pte. Ltd.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Application
ACCESSORY FOR ATTENUATED TOTAL INTERNAL REFLECTANCE (ATR) SPECTROSCOPY
- Publication number 20130301923
- Publication date Nov 14, 2013
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
SPECTROSCOPIC INSTRUMENT
- Publication number 20130220014
- Publication date Aug 29, 2013
- PerkinElmer Singapore Pte. Ltd.
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
Processing Data From A CCD And CCD Imaging Apparatus To Correct Sme...
- Publication number 20120194704
- Publication date Aug 2, 2012
- Antonio Canas Wilkinson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DIFFERENTIAL SCANNING CALORIMETRY AND CALIBRATION METHODS FOR USE T...
- Publication number 20110313713
- Publication date Dec 22, 2011
- PerkinElmer Health Sciences, Inc.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Application
Measurement of Sample Reflectance
- Publication number 20090323072
- Publication date Dec 31, 2009
- PerkinElmer LAS, Inc.
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Application
Relating to Scanning Confocal Microscopy
- Publication number 20090279169
- Publication date Nov 12, 2009
- PerkinElmer Singapore Pte. Ltd.
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
Method Of Processing Data From A CCD And CCD Imaging Apparatus
- Publication number 20090174796
- Publication date Jul 9, 2009
- Antonio Canas Wilkinson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Accessory for attenuated total internal reflectance (ATR) spectroscopy
- Publication number 20090127463
- Publication date May 21, 2009
- PerkinElmer Singapore Pte. Ltd.
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
ACCESSORY FOR ATTENUATED TOTAL INTERNAL REFLECTANCE (ATR) SPECTROSCOPY
- Publication number 20090034065
- Publication date Feb 5, 2009
- PerkinElmer Singapore PTE Ltd.
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
Accessory For Attenuated Total Internal Reflective (Atr) Spectroscopy
- Publication number 20090002815
- Publication date Jan 1, 2009
- PekinElmer Singapore PTE Ltd.
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
Accessory for Attenuated Total Internal Reflectance (Atr) Spectroscopy
- Publication number 20080285122
- Publication date Nov 20, 2008
- Perkin Elmer Singapore PTE Ltd.
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
Method and Apparatus For Analyzing a Dynamic Sample
- Publication number 20080217557
- Publication date Sep 11, 2008
- Patrick Courtney
- G01 - MEASURING TESTING
Information Patent Application
Small Detector Array For Infrared Imaging Microscope
- Publication number 20080135763
- Publication date Jun 12, 2008
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
Detector array and cross-talk linearity connection
- Publication number 20060202124
- Publication date Sep 14, 2006
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
Measurement of sample reflectance
- Publication number 20050185185
- Publication date Aug 25, 2005
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Application
Scanning IR microscope
- Publication number 20040222378
- Publication date Nov 11, 2004
- Ralph Lance Carter
- G02 - OPTICS
Information Patent Application
SUPPRESSION OF UNDESIRED COMPONENTS IN THE MEASURED SPECTRA OF SPEC...
- Publication number 20030098417
- Publication date May 29, 2003
- Robert Alan Hoult
- G01 - MEASURING TESTING
Information Patent Application
Dual magnification for infrared imaging microscope
- Publication number 20020034000
- Publication date Mar 21, 2002
- Robert Alan Hoult
- G02 - OPTICS
Information Patent Application
Small detector array for infrared imaging microscope
- Publication number 20020033452
- Publication date Mar 21, 2002
- Robert Alan Hoult
- G01 - MEASURING TESTING

Robert Alan Hoult

Person

Patents Grantslast 30 patents

Diffuse reflectance infrared fourier transform spectroscopy

Identifying presence of substrates

Diffuse reflectance infrared Fourier transform spectroscopy

Identifying presence of substances

Diffuse reflectance infrared Fourier transform spectroscopy

Spectroscopic instrument

Spectroscopic instruments and foot portions for spectroscopic instr...

Differential scanning calorimetry and calibration methods for use t...

Systems and methods for attenuated total internal reflectance (ATR)...

Accessory for attenuated total internal reflectance (ATR) spectroscopy

Accessory for attenuated total internal reflectance (ATR) spectroscopy

Measurement of sample reflectance

Relating to scanning confocal microscopy

Accessory for attenuated total internal reflective (ATR) spectroscopy

Accessory for attenuated total internal reflectance (ATR) spectroscopy

Processing data from a CCD and CCD imaging apparatus to correct sme...

Accessory for attenuated total internal reflectance (ATR) spectroscopy

Measurement of sample reflectance

Detector array and cross-talk linearity connection

Method and apparatus for analyzing a dynamic sample

Small detector array for infrared imaging microscope

Scanning IR microscope

Suppression of undesired components in the measured spectra of spec...

Suppression of undesired components in the measured spectra of spec...

Reflectance sampler and method of use

Mounting of optical components

Standardizing a spectrometric instrument

Probe for spectroscopic analysis

Digitisation of interferograms in Fourier transform spectroscopy

Carrier and its use in the preparation of samples for spectroscopy

Patents Applicationslast 30 patents

DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY

IDENTIFYING PRESENCE OF SUBSTANCES

DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY

IDENTIFYING PRESENCE OF SUBSTANCES

DIFFUSE REFLECTANCE INFRARED FOURIER TRANSFORM SPECTROSCOPY

DIAMOND ATR ARTEFACT CORRECTION

SPECTROSCOPIC INSTRUMENTS AND FOOT PORTIONS FOR SPECTROSCOPIC INSTR...

ACCESSORY FOR ATTENUATED TOTAL INTERNAL REFLECTANCE (ATR) SPECTROSCOPY

SPECTROSCOPIC INSTRUMENT

Processing Data From A CCD And CCD Imaging Apparatus To Correct Sme...

DIFFERENTIAL SCANNING CALORIMETRY AND CALIBRATION METHODS FOR USE T...

Measurement of Sample Reflectance

Relating to Scanning Confocal Microscopy

Method Of Processing Data From A CCD And CCD Imaging Apparatus

Accessory for attenuated total internal reflectance (ATR) spectroscopy

ACCESSORY FOR ATTENUATED TOTAL INTERNAL REFLECTANCE (ATR) SPECTROSCOPY

Accessory For Attenuated Total Internal Reflective (Atr) Spectroscopy

Accessory for Attenuated Total Internal Reflectance (Atr) Spectroscopy

Method and Apparatus For Analyzing a Dynamic Sample

Small Detector Array For Infrared Imaging Microscope

Detector array and cross-talk linearity connection

Measurement of sample reflectance

Scanning IR microscope

SUPPRESSION OF UNDESIRED COMPONENTS IN THE MEASURED SPECTRA OF SPEC...

Dual magnification for infrared imaging microscope

Small detector array for infrared imaging microscope