ROBERT ALBERT THARALDSEN

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SHERMAN, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Lithographic apparatus and device manufacturing method
- Patent number 9,594,030
- Issue date Mar 14, 2017
- ASML Holding N.V.
- Yuli Vladimirsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Diffraction elements for alignment targets
- Patent number 8,681,313
- Issue date Mar 25, 2014
- ASML Holding N.V.
- Yuli Vladimirsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Time differential reticle inspection
- Patent number 8,623,576
- Issue date Jan 7, 2014
- ASML Holding N.V.
- Eric Brian Catey
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle inspection systems and method
- Patent number 8,189,203
- Issue date May 29, 2012
- ASML Holding N.V.
- Yevgeniy Konstantinovich Shmarev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WHITE CELL FOR FLUID DETECTION
- Publication number 20150062572
- Publication date Mar 5, 2015
- Robert Tharaldsen
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
- Publication number 20140264054
- Publication date Sep 18, 2014
- ASML Holding N.V.
- Yuli Vladimirsky
- G01 - MEASURING TESTING
Information Patent Application
Holographic Mask Inspection System with Spatial Filter
- Publication number 20120281197
- Publication date Nov 8, 2012
- ASML NETHERLANDS B.V.
- Robert Albert Tharaldsen
- G01 - MEASURING TESTING
Information Patent Application
Time Differential Reticle Inspection
- Publication number 20120171600
- Publication date Jul 5, 2012
- ASML Holding N.V.
- Eric Brian Catey
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Diffraction Elements for Alignment Targets
- Publication number 20110019173
- Publication date Jan 27, 2011
- ASML Holding N.V.
- Yuli Vladimirsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Reticle Inspection Systems and Method
- Publication number 20100149548
- Publication date Jun 17, 2010
- ASML Holding N.V.
- YEVGENIY KONSTANTINOVICH SHMAREV
- G01 - MEASURING TESTING