Robert B. Howe

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Spatial filter for optically based defect inspection system
- Patent number 5,172,000
- Issue date Dec 15, 1992
- Insystems, Inc.
- Victor A. Scheff
- G02 - OPTICS
Information Patent Grant
Inspection system for array of microcircuit dies having redundant c...
- Patent number RE33956
- Issue date Jun 9, 1992
- Insystems, Inc.
- Lawrence H. Lin
- 250 - Radiant energy
Information Patent Grant
Inspection system for array of microcircuit dies having redundant c...
- Patent number 4,806,774
- Issue date Feb 21, 1989
- Insystems, Inc.
- Lawrence H. Lin
- G01 - MEASURING TESTING