Robert Bailey

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device testing system
- Patent number 7,941,718
- Issue date May 10, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Zaifu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Shared latch for memory test/repair and functional operations
- Patent number 7,707,466
- Issue date Apr 27, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Ravi Gupta
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SHARED LATCH FOR MEMORY TEST/REPAIR AND FUNCTIONAL OPERATIONS
- Publication number 20080209283
- Publication date Aug 28, 2008
- FREESCALE SEMICONDUCTOR, INC.
- Ravi Gupta
- G11 - INFORMATION STORAGE
Information Patent Application
Electronic device testing system
- Publication number 20070214398
- Publication date Sep 13, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Zaifu Zhang
- G01 - MEASURING TESTING