Robert Baraniecki

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Kirchheim-Teck, DE

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Patents Grantslast 30 patents

Information Patent Grant
On-chip test technique for low drop-out regulators
- Patent number 9,151,804
- Issue date Oct 6, 2015
- Dialog Semiconductor GmbH
- Dietmar Orendi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
On-Chip Test Technique for Low Drop-Out Regulators
- Publication number 20130265060
- Publication date Oct 10, 2013
- DIALOG SEMICONDUCTOR GMBH
- Dietmar Orendi
- G01 - MEASURING TESTING