Robert Baraniecki

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Patents Grantslast 30 patents

Information Patent Grant
On-chip test technique for low drop-out regulators
- Patent number 9,465,086
- Issue date Oct 11, 2016
- Dialog Semiconductor GmbH
- Dietmar Orendi
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Novel On-Chip Test Technique for Low Drop-Out Regulators
- Publication number 20150377981
- Publication date Dec 31, 2015
- DIALOG SEMICONDUCTOR GMBH
- Dietmar Orendi
- G01 - MEASURING TESTING