Robert Benware

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Ft. Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods of screening ASIC defects using independent component analy...
- Patent number 7,171,638
- Issue date Jan 30, 2007
- LSI Logic Corporation
- Ritesh P. Turakhia
- G01 - MEASURING TESTING
Information Patent Grant
Modified binary search for optimizing efficiency of data collection...
- Patent number 7,079,963
- Issue date Jul 18, 2006
- LSI Logic Corporation
- Cary Gloor
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of generating an efficient stuck-at fault and transition del...
- Patent number 7,058,909
- Issue date Jun 6, 2006
- LSI Logic Corporation
- Cam L. Lu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of screening ASIC defects using independent component analys...
- Publication number 20060085771
- Publication date Apr 20, 2006
- LSI Logic Corporation
- Ritesh P. Turakhia
- G01 - MEASURING TESTING
Information Patent Application
Method of generating an efficient stuck-at fault and transition del...
- Publication number 20050125755
- Publication date Jun 9, 2005
- Cam L. Lu
- G01 - MEASURING TESTING
Information Patent Application
Modified binary search for optimizing efficiency of data collection...
- Publication number 20040205052
- Publication date Oct 14, 2004
- Cary Gloor
- G05 - CONTROLLING REGULATING