Robert Brady Benware

Person

Clackamas, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Generating root cause candidates for yield analysis
- Patent number 10,496,779
- Issue date Dec 3, 2019
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit defect diagnosis based on sink cell fault models
- Patent number 10,234,502
- Issue date Mar 19, 2019
- Mentor Graphics Corporation
- Huaxing Tang
- G01 - MEASURING TESTING
Information Patent Grant
Identifying the defective layer of a yield excursion through the st...
- Patent number 10,198,548
- Issue date Feb 5, 2019
- Mentor Graphics Corporation
- Manish Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic design partitioning for diagnosis
- Patent number 9,857,421
- Issue date Jan 2, 2018
- Mentor Graphics Corporation
- Huaxing Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating root cause candidates for yield analysis
- Patent number 9,443,051
- Issue date Sep 13, 2016
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Canonical forms of layout patterns
- Patent number 9,378,327
- Issue date Jun 28, 2016
- Mentor Graphics Corporation
- Wu-Tung Cheng
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Dynamic design partitioning for diagnosis
- Patent number 9,336,107
- Issue date May 10, 2016
- Mentor Graphics Corporation
- Huaxing Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic design partitioning for scan chain diagnosis
- Patent number 9,244,125
- Issue date Jan 26, 2016
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Test access mechanism for diagnosis based on partitioning scan chains
- Patent number 9,026,874
- Issue date May 5, 2015
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Root cause distribution determination based on layout aware scan di...
- Patent number 8,930,782
- Issue date Jan 6, 2015
- Mentor Graphics Corporation
- Robert Brady Benware
- G01 - MEASURING TESTING
Information Patent Grant
Fault diagnosis based on design partitioning
- Patent number 8,707,232
- Issue date Apr 22, 2014
- Mentor Graphics Corporation
- Huaxing Tang
- G01 - MEASURING TESTING
Information Patent Grant
Test access mechanism for diagnosis based on partitioining scan chains
- Patent number 8,607,107
- Issue date Dec 10, 2013
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects in integrated circuit di...
- Patent number 7,617,427
- Issue date Nov 10, 2009
- LSI Corporation
- Steven L. Haehn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GENERATING ROOT CAUSE CANDIDATES FOR YIELD ANALYSIS
- Publication number 20170103158
- Publication date Apr 13, 2017
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC DESIGN PARTITIONING FOR DIAGNOSIS
- Publication number 20160245866
- Publication date Aug 25, 2016
- Mentor Graphics Corporation
- Huaxing Tang
- G01 - MEASURING TESTING
Information Patent Application
Cell Internal Defect Diagnosis
- Publication number 20150234978
- Publication date Aug 20, 2015
- Mentor Graphics Corporation
- Huaxing Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Canonical Forms Of Layout Patterns
- Publication number 20150135151
- Publication date May 14, 2015
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Design Partitioning For Scan Chain Diagnosis
- Publication number 20140164859
- Publication date Jun 12, 2014
- Mentor Graphics Corporation
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Application
TEST ACCESS MECHANISM FOR DIAGNOSIS BASED ON PARTITIONING SCAN CHAINS
- Publication number 20140101506
- Publication date Apr 10, 2014
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
Generating Root Cause Candidates For Yield Analysis
- Publication number 20140059511
- Publication date Feb 27, 2014
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Design Partitioning For Diagnosis
- Publication number 20130145213
- Publication date Jun 6, 2013
- Mentor Graphics Corporation
- Huaxing Tang
- G01 - MEASURING TESTING
Information Patent Application
Fault Diagnosis Based On Design Partitioning
- Publication number 20130024830
- Publication date Jan 24, 2013
- Huaxing Tang
- G01 - MEASURING TESTING
Information Patent Application
Root Cause Distribution Determination Based On Layout Aware Scan Di...
- Publication number 20120297264
- Publication date Nov 22, 2012
- Mentor Graphics Corporation
- Robert Brady Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST ACCESS MECHANISM FOR DIAGNOSIS BASED ON PARTITIOINING SCAN CHAINS
- Publication number 20110258504
- Publication date Oct 20, 2011
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Identifying the Defective Layer of a Yield Excursion Through the St...
- Publication number 20110184702
- Publication date Jul 28, 2011
- Manish Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Unique binary identifier using existing state elements
- Publication number 20080052029
- Publication date Feb 28, 2008
- LSI Logic Corporation
- Robert B. Benware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for detecting defects in integrated circuit di...
- Publication number 20070157056
- Publication date Jul 5, 2007
- LSI Logic Corporation
- Steven L. Haehn
- G01 - MEASURING TESTING

Robert Brady Benware

Person

Patents Grantslast 30 patents

Generating root cause candidates for yield analysis

Circuit defect diagnosis based on sink cell fault models

Identifying the defective layer of a yield excursion through the st...

Dynamic design partitioning for diagnosis

Generating root cause candidates for yield analysis

Canonical forms of layout patterns

Dynamic design partitioning for diagnosis

Dynamic design partitioning for scan chain diagnosis

Test access mechanism for diagnosis based on partitioning scan chains

Root cause distribution determination based on layout aware scan di...

Fault diagnosis based on design partitioning

Test access mechanism for diagnosis based on partitioining scan chains

Method and apparatus for detecting defects in integrated circuit di...

Patents Applicationslast 30 patents

GENERATING ROOT CAUSE CANDIDATES FOR YIELD ANALYSIS

DYNAMIC DESIGN PARTITIONING FOR DIAGNOSIS

Cell Internal Defect Diagnosis

Canonical Forms Of Layout Patterns

Dynamic Design Partitioning For Scan Chain Diagnosis

TEST ACCESS MECHANISM FOR DIAGNOSIS BASED ON PARTITIONING SCAN CHAINS

Generating Root Cause Candidates For Yield Analysis

Dynamic Design Partitioning For Diagnosis

Fault Diagnosis Based On Design Partitioning

Root Cause Distribution Determination Based On Layout Aware Scan Di...

TEST ACCESS MECHANISM FOR DIAGNOSIS BASED ON PARTITIOINING SCAN CHAINS

Identifying the Defective Layer of a Yield Excursion Through the St...

Unique binary identifier using existing state elements

Method and apparatus for detecting defects in integrated circuit di...