Robert Buchanan

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Metrology/inspection positioning system
- Patent number 7,295,314
- Issue date Nov 13, 2007
- Nanometrics Incorporated
- Blaine R. Spady
- G01 - MEASURING TESTING
Information Patent Grant
Image control in a metrology/inspection positioning system
- Patent number 7,289,215
- Issue date Oct 30, 2007
- Nanometrics Incorporated
- Blaine R. Spady
- G02 - OPTICS
Information Patent Grant
System using a polar coordinate stage and continuous image rotation...
- Patent number 6,320,609
- Issue date Nov 20, 2001
- Nanometrics Incorporated
- Robert Buchanan
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE CONTROL IN A METROLOGY/INSPECTION POSITIONING SYSTEM
- Publication number 20070222991
- Publication date Sep 27, 2007
- Nanometrics Incorporated
- Blaine R. Spady
- G02 - OPTICS