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Robert C. Abbe
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Newton, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and apparatus for reducing error in interferometric imaging...
Patent number
7,184,149
Issue date
Feb 27, 2007
Dimensional Photonics International, Inc.
Gary J. Swanson
G01 - MEASURING TESTING
Information
Patent Grant
Sensor for measuring degree of flatness
Patent number
6,255,664
Issue date
Jul 3, 2001
Super Silicon Crystal Research Institute Corp.
Shinji Okawa
G01 - MEASURING TESTING
Information
Patent Grant
Wafer handling and processing system
Patent number
5,511,005
Issue date
Apr 23, 1996
ADE Corporation
Robert C. Abbe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-probe grouping system with nonlinear error correction
Patent number
4,910,453
Issue date
Mar 20, 1990
ADE Corporation
Robert C. Abbe
G01 - MEASURING TESTING
Information
Patent Grant
Rotary to linear motion robot arm
Patent number
4,897,015
Issue date
Jan 30, 1990
ADE Corporation
Robert C. Abbe
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Wafer flatness station
Patent number
4,860,229
Issue date
Aug 22, 1989
ADE Corporation
Robert C. Abbe
G01 - MEASURING TESTING
Information
Patent Grant
Improved spatial resolution measurement system and method
Patent number
4,849,916
Issue date
Jul 18, 1989
ADE Corporation
Robert C. Abbe
G01 - MEASURING TESTING
Information
Patent Grant
Self inverting gauging system
Patent number
4,353,029
Issue date
Oct 5, 1982
ADE Corporation
Robert C. Abbe
G01 - MEASURING TESTING
Information
Patent Grant
Second order correction in linearized proximity probe
Patent number
4,228,392
Issue date
Oct 14, 1980
ADE Corporation
Robert C. Abbe
G01 - MEASURING TESTING
Information
Patent Grant
Self inverting gauging system
Patent number
4,217,542
Issue date
Aug 12, 1980
ADE Corporation
Robert C. Abbe
G01 - MEASURING TESTING
Information
Patent Grant
Wafer edge detection system
Patent number
4,158,171
Issue date
Jun 12, 1979
ADE Corporation
Robert C. Abbe
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive thickness gauging for ungrounded elements
Patent number
3,990,005
Issue date
Nov 2, 1976
ADE Corporation
Robert C. Abbe
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Methods and Apparatus for Reducing Error in Interferometric Imaging...
Publication number
20070109556
Publication date
May 17, 2007
DIMENSIONAL PHOTONICS INTERNATIONAL, INC.
Gary J. Swanson
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for reducing error in interferometric imaging...
Publication number
20050024648
Publication date
Feb 3, 2005
Gary J. Swanson
G01 - MEASURING TESTING