Robert C. Hash

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Low cost test for IC's or electrical modules using standard reconfi...
- Patent number 7,412,342
- Issue date Aug 12, 2008
- Intel Corporation
- Stephen S. Sturges
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for in-circuit testing of sockets
- Patent number 6,734,683
- Issue date May 11, 2004
- Intel Corporation
- Robert C. Hash
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Low cost test for IC's or electrical modules using standard reconfi...
- Publication number 20060100812
- Publication date May 11, 2006
- Stephen S. Sturges
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for in-circuit testing of sockets
- Publication number 20030057981
- Publication date Mar 27, 2003
- Robert C. Hash
- G01 - MEASURING TESTING