Membership
Tour
Register
Log in
Robert David Conklin
Follow
Person
Chandler, AZ, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Initial stage of a multi-stage algorithmic pattern generator for te...
Patent number
6,571,365
Issue date
May 27, 2003
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING
Information
Patent Grant
Output stage of a multi-stage algorithmic pattern generator for tes...
Patent number
6,480,981
Issue date
Nov 12, 2002
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING
Information
Patent Grant
Intermediate stage of a multi-stage algorithmic pattern generator f...
Patent number
6,477,676
Issue date
Nov 5, 2002
Unisys Corporation
James Vernon Rhodes
G11 - INFORMATION STORAGE
Information
Patent Grant
Multi-stage algorithmic pattern generator for testing IC chips
Patent number
6,415,408
Issue date
Jul 2, 2002
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING
Information
Patent Grant
System for testing IC chips selectively with stored or internally g...
Patent number
6,415,409
Issue date
Jul 2, 2002
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING
Information
Patent Grant
Program storage device containing instructions that are spaced apar...
Patent number
6,405,150
Issue date
Jun 11, 2002
Unisys Corporation
James Vernon Rhodes
G11 - INFORMATION STORAGE
Information
Patent Grant
Electronic system for testing a set of multiple chips concurrently...
Patent number
6,363,504
Issue date
Mar 26, 2002
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING
Information
Patent Grant
Electronic system for testing chips having a selectable number of p...
Patent number
6,363,510
Issue date
Mar 26, 2002
Unisys Corporation
James Vernon Rhodes
G01 - MEASURING TESTING