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Boise, ID, US
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last 30 patents
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Patent Grant
Wafer alignment markers, systems, and related methods
Patent number
11,520,240
Issue date
Dec 6, 2022
Micron Technology, Inc.
Nikolay A. Mirin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wafer registration and overlay measurement systems and related methods
Patent number
11,251,096
Issue date
Feb 15, 2022
Micron Technology, Inc.
Nikolay A. Mirin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus comprising staircase structures
Patent number
11,189,526
Issue date
Nov 30, 2021
Micron Technology, Inc.
Lance Williamson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wafer alignment markers, systems, and related methods
Patent number
11,009,798
Issue date
May 18, 2021
Micron Technology, Inc.
Nikolay A. Mirin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming staircase structures
Patent number
10,600,681
Issue date
Mar 24, 2020
Micron Technology, Inc.
Lance Williamson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming staircase structures
Patent number
10,147,638
Issue date
Dec 4, 2018
Micron Technology, Inc.
Lance Williamson
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
WAFER REGISTRATION AND OVERLAY MEASUREMENT SYSTEMS AND RELATED METHODS
Publication number
20220108927
Publication date
Apr 7, 2022
Micron Technology, Inc.
Nikolay A. Mirin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER ALIGNMENT MARKERS, SYSTEMS, AND RELATED METHODS
Publication number
20210263429
Publication date
Aug 26, 2021
Micron Technology, Inc.
Nikolay A. Mirin
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS COMPRISING STAIRCASE STRUCTURES
Publication number
20200194305
Publication date
Jun 18, 2020
Micron Technology, Inc.
Lance Williamson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER REGISTRATION AND OVERLAY MEASUREMENT SYSTEMS AND RELATED METHODS
Publication number
20200075432
Publication date
Mar 5, 2020
Micron Technology, Inc.
Nikolay A. Mirin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER ALIGNMENT MARKERS, SYSTEMS, AND RELATED METHODS
Publication number
20200073257
Publication date
Mar 5, 2020
Micron Technology, Inc.
Nikolay A. Mirin
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF FORMING STAIRCASE STRUCTURES
Publication number
20190206726
Publication date
Jul 4, 2019
Micron Technology, Inc.
Lance Williamson
H01 - BASIC ELECTRIC ELEMENTS