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THROUGH SILICON VIA FABRICATION
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Publication number 20220406659
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Publication date Dec 22, 2022
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Quantinuum LLC
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Robert Edward Higashi
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H01 - BASIC ELECTRIC ELEMENTS
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THROUGH SILICON VIA FABRICATION
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Publication number 20210082759
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Publication date Mar 18, 2021
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HONEYWELL INTERNATIONAL INC.
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Robert Edward Higashi
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H01 - BASIC ELECTRIC ELEMENTS
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THROUGH SILICON VIA FABRICATION
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Publication number 20200365459
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Publication date Nov 19, 2020
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HONEYWELL INTERNATIONAL INC.
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Robert E. Higashi
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H01 - BASIC ELECTRIC ELEMENTS
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INFRARED IMAGER
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Publication number 20140312230
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Publication date Oct 23, 2014
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Honeywell International Inc.
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Barrett E. Cole
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G01 - MEASURING TESTING
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THERMAL CONDUCTIVITY DETECTORS
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Publication number 20120024043
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Publication date Feb 2, 2012
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Honeywell International Inc.
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Adam D. McBrady
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G01 - MEASURING TESTING
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PASSIVE INFRARED IMAGER
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Publication number 20110279680
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Publication date Nov 17, 2011
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Honeywell International Inc.
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Barrett E. Cole
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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HIGH PERFORMANCE DETECTION PIXEL
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Publication number 20110267322
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Publication date Nov 3, 2011
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Honeywell International Inc.
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Barrett E. Cole
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G01 - MEASURING TESTING
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INTEGRAL TOPSIDE VACUUM PACKAGE
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Publication number 20110070401
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Publication date Mar 24, 2011
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Honeywell International Inc.
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Robert E. Higashi
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G01 - MEASURING TESTING
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A THERMAL PUMP
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Publication number 20100239436
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Publication date Sep 23, 2010
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Honeywell International Inc.
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Ulrich Bonne
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G01 - MEASURING TESTING
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Shell flow sensor
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Publication number 20090044620
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Publication date Feb 19, 2009
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Honeywell International Inc.
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Robert E. Higashi
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G01 - MEASURING TESTING