Robert G. Blunn

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dynamically adaptable semiconductor parametric testing
- Patent number 7,383,147
- Issue date Jun 3, 2008
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent measurement modular semiconductor parametric test system
- Patent number 7,337,088
- Issue date Feb 26, 2008
- Micron Technology, Inc.
- Sergey A. Velichko
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically adaptable semiconductor parametric testing
- Patent number 7,165,004
- Issue date Jan 16, 2007
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically adaptable semiconductor parametric testing
- Patent number 7,162,386
- Issue date Jan 9, 2007
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically adaptable semiconductor parametric testing
- Patent number 7,139,672
- Issue date Nov 21, 2006
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Concurrent control of semiconductor parametric testing
- Publication number 20070112538
- Publication date May 17, 2007
- Micron Technology, Inc.
- Sergey A. Velichko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT MEASUREMENT MODULAR SEMICONDUCTOR PARAMETRIC TEST SYSTEM
- Publication number 20060212253
- Publication date Sep 21, 2006
- Micron Technology, Inc.
- Sergey A. Velichko
- G01 - MEASURING TESTING
Information Patent Application
Dynamically adaptable semiconductor parametric testing
- Publication number 20060125509
- Publication date Jun 15, 2006
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Application
Dynamically adaptable semiconductor parametric testing
- Publication number 20060122803
- Publication date Jun 8, 2006
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Application
Dynamically adaptable semiconductor parametric testing
- Publication number 20050021273
- Publication date Jan 27, 2005
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Application
Dynamically adaptable semiconductor parametric testing
- Publication number 20030212523
- Publication date Nov 13, 2003
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Application
Intelligent measurement modular semiconductor parametric test system
- Publication number 20030028343
- Publication date Feb 6, 2003
- Micron Technology, Inc.
- Sergey A. Velichko
- G01 - MEASURING TESTING
Information Patent Application
Concurrent control of semiconductor parametric testing
- Publication number 20020152046
- Publication date Oct 17, 2002
- Sergey A. Velichko
- G01 - MEASURING TESTING

Robert G. Blunn

Person

Patents Grantslast 30 patents

Dynamically adaptable semiconductor parametric testing

Intelligent measurement modular semiconductor parametric test system

Dynamically adaptable semiconductor parametric testing

Dynamically adaptable semiconductor parametric testing

Dynamically adaptable semiconductor parametric testing

Patents Applicationslast 30 patents

Concurrent control of semiconductor parametric testing

INTELLIGENT MEASUREMENT MODULAR SEMICONDUCTOR PARAMETRIC TEST SYSTEM

Dynamically adaptable semiconductor parametric testing

Dynamically adaptable semiconductor parametric testing

Dynamically adaptable semiconductor parametric testing

Dynamically adaptable semiconductor parametric testing

Intelligent measurement modular semiconductor parametric test system

Concurrent control of semiconductor parametric testing