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Robert G. Jacobson
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Brentwood, CA, US
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last 30 patents
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Patent Grant
In-circuit testing system
Patent number
4,791,356
Issue date
Dec 13, 1988
Zehntel Incorporation
Frederick E. Warren
G01 - MEASURING TESTING
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Patent Grant
In-circuit digital tester for testing microprocessor boards
Patent number
4,500,993
Issue date
Feb 19, 1985
Zehntel, Inc.
Robert G. Jacobson
G01 - MEASURING TESTING
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Patent Grant
Programmable sequence generator for in-circuit digital testing
Patent number
4,339,819
Issue date
Jul 13, 1982
Zehntel, Inc.
Robert G. Jacobson
G01 - MEASURING TESTING