Robert G. Mazur

Person

Monroeville, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring semiconductor wafer electrical p...
- Patent number 6,972,582
- Issue date Dec 6, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Flexible membrane probe and method of use thereof
- Patent number 6,900,652
- Issue date May 31, 2005
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive electrical measurement of semiconductor wafers
- Patent number 6,492,827
- Issue date Dec 10, 2002
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact capacitance measuring device
- Patent number 6,150,832
- Issue date Nov 21, 2000
- Solid State Measurements, Inc.
- Robert G. Mazur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spreading resistance profiling system
- Patent number 6,052,653
- Issue date Apr 18, 2000
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for characterization of electrical properties of a semico...
- Patent number 5,036,271
- Issue date Jul 30, 1991
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for abrading workpieces, particularly semiconductor wafers
- Patent number 4,489,521
- Issue date Dec 25, 1984
- Solid State Measurements, Inc.
- Robert G. Mazur
- B24 - GRINDING POLISHING
Information Patent Grant
Lapping and polishing apparatus
- Patent number 3,978,622
- Issue date Sep 7, 1976
- Solid State Measurements, Inc.
- Robert G. Mazur
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
Method of testing semiconductor wafers with non-penetrating probes
- Publication number 20050225345
- Publication date Oct 13, 2005
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE MEMBRANE PROBE AND METHOD OF USE THEREOF
- Publication number 20040251923
- Publication date Dec 16, 2004
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring semiconductor wafer electrical p...
- Publication number 20040155240
- Publication date Aug 12, 2004
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING

Robert G. Mazur

Person

Patents Grantslast 30 patents

Apparatus and method for measuring semiconductor wafer electrical p...

Flexible membrane probe and method of use thereof

Non-invasive electrical measurement of semiconductor wafers

Noncontact capacitance measuring device

Spreading resistance profiling system

Apparatus for characterization of electrical properties of a semico...

Apparatus for abrading workpieces, particularly semiconductor wafers

Lapping and polishing apparatus

Patents Applicationslast 30 patents

Method of testing semiconductor wafers with non-penetrating probes

FLEXIBLE MEMBRANE PROBE AND METHOD OF USE THEREOF

Apparatus and method for measuring semiconductor wafer electrical p...