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Robert G. O'Neill
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Edge ring arrangement with moveable edge rings
Patent number
12,027,410
Issue date
Jul 2, 2024
Lam Research Corporation
Haoquan Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Moveable edge coupling ring for edge process control during semicon...
Patent number
10,658,222
Issue date
May 19, 2020
Lam Research Corporation
Haoquan Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Coating system and method for coating interior fluid wetted surface...
Patent number
9,873,940
Issue date
Jan 23, 2018
Lam Research Corporation
Lin Xu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Application of powered electrostatic faraday shield to recondition...
Patent number
9,767,996
Issue date
Sep 19, 2017
Lam Research Corporation
Robert G. O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dense oxide coated component of a plasma processing chamber and met...
Patent number
9,546,432
Issue date
Jan 17, 2017
Lam Research Corporation
Hong Shih
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Calculating power input to an array of thermal control elements to...
Patent number
9,435,692
Issue date
Sep 6, 2016
Lam Research Corporation
Ole Waldmann
G01 - MEASURING TESTING
Information
Patent Grant
System, method and apparatus for RF power compensation in plasma et...
Patent number
9,412,670
Issue date
Aug 9, 2016
Lam Research Corporation
Robert G. O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Corrosion resistant aluminum coating on plasma chamber components
Patent number
9,337,002
Issue date
May 10, 2016
Lam Research Corporation
John Daugherty
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Grant
Dense oxide coated component of a plasma processing chamber and met...
Patent number
9,123,651
Issue date
Sep 1, 2015
Lam Research Corporation
Hong Shih
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method and system for centering wafer on chuck
Patent number
8,060,330
Issue date
Nov 15, 2011
Lam Research Corporation
Robert Griffith O'Neill
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
EDGE RING ARRANGEMENT WITH MOVEABLE EDGE RINGS
Publication number
20240355667
Publication date
Oct 24, 2024
LAM RESEARCH CORPORATION
Haoquan Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EDGE RING ARRANGEMENT WITH MOVEABLE EDGE RINGS
Publication number
20210183687
Publication date
Jun 17, 2021
LAM RESEARCH CORPORATION
Haoquan Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MOVEABLE EDGE RING DESIGN
Publication number
20190013232
Publication date
Jan 10, 2019
LAM RESEARCH CORPORATION
Haoquan Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COATING SYSTEM AND METHOD FOR COATING INTERIOR FLUID WETTED SURFACE...
Publication number
20180127868
Publication date
May 10, 2018
LAM RESEARCH CORPORATION
Lin XU
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
APPLICATION OF POWERED ELECTROSTATIC FARADAY SHIELD TO RECONDITION...
Publication number
20170053782
Publication date
Feb 23, 2017
LAM RESEARCH CORPORATION
Robert G. O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MOVEABLE EDGE COUPLING RING FOR EDGE PROCESS CONTROL DURING SEMICON...
Publication number
20160211166
Publication date
Jul 21, 2016
LAM RESEARCH CORPORATION
Haoquan Yan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DENSE OXIDE COATED COMPONENT OF A PLASMA PROCESSING CHAMBER AND MET...
Publication number
20150337450
Publication date
Nov 26, 2015
LAM RESEARCH CORPORATION
Hong SHIH
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
CALCULATING POWER INPUT TO AN ARRAY OF THERMAL CONTROL ELEMENTS TO...
Publication number
20150219499
Publication date
Aug 6, 2015
LAM RESEARCH CORPORATION
Ole Waldmann
G01 - MEASURING TESTING
Information
Patent Application
COMPONENT OF A PLASMA PROCESSING APPARATUS INCLUDING AN ELECTRICALL...
Publication number
20150187615
Publication date
Jul 2, 2015
LAM RESEARCH CORPORATION
John Daugherty
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
COATING SYSTEM AND METHOD FOR COATING INTERIOR FLUID WETTED SURFACE...
Publication number
20150184296
Publication date
Jul 2, 2015
Lam Research Corporation
Lin Xu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
System, Method and Apparatus for RF Power Compensation in Plasma Et...
Publication number
20140349417
Publication date
Nov 27, 2014
LAM RESEARCH CORPORATION
Robert G. O'Neill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DENSE OXIDE COATED COMPONENT OF A PLASMA PROCESSING CHAMBER AND MET...
Publication number
20140295670
Publication date
Oct 2, 2014
LAM RESEARCH CORPORATION
Hong Shih
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
CORROSION RESISTANT ALUMINUM COATING ON PLASMA CHAMBER COMPONENTS
Publication number
20140272459
Publication date
Sep 18, 2014
LAM RESEARCH CORPORATION
John Daugherty
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Application
EDGE RING ASSEMBLY FOR PLASMA PROCESSING CHAMBER AND METHOD OF MANU...
Publication number
20140034242
Publication date
Feb 6, 2014
LAM RESEARCH CORPORATION
Sanket P. Sant
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPONENTS OF PLASMA PROCESSING CHAMBERS HAVING TEXTURED PLASMA RES...
Publication number
20130102156
Publication date
Apr 25, 2013
LAM RESEARCH CORPORATION
Tom Stevenson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and System for Centering Wafer on Chuck
Publication number
20100150695
Publication date
Jun 17, 2010
LAM RESEARCH CORPORATION
Robert Griffith O'Neill
G01 - MEASURING TESTING