ROBERT GABRIEL ALMENDAREZ

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CARROLLTON, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit spike check apparatus and method
- Patent number 11,639,960
- Issue date May 2, 2023
- Texas Instruments Incorporated
- Robert Gabriel Almendarez
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment (ATE) platform translation
- Patent number 10,481,206
- Issue date Nov 19, 2019
- Texas Instruments Incorporated
- Ramana Tadepalli
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT SPIKE CHECK APPARATUS AND METHOD
- Publication number 20210286003
- Publication date Sep 16, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Robert Gabriel Almendarez
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT (ATE) PLATFORM TRANSLATION
- Publication number 20180067161
- Publication date Mar 8, 2018
- TEXAS INSTRUMENTS INCORPORATED
- RAMANA TADEPALLI
- G01 - MEASURING TESTING