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Robert H. Berg
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Elmhurst, IL, US
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last 30 patents
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Patent Grant
Method and apparatus for coincidence correction in electrozone part...
Patent number
5,247,461
Issue date
Sep 21, 1993
Particle Data, Inc.
Robert H. Berg
G01 - MEASURING TESTING
Information
Patent Grant
Multi-sample particle analysis apparatus and method
Patent number
4,471,297
Issue date
Sep 11, 1984
Particle Data, Inc.
Robert H. Berg
G01 - MEASURING TESTING
Information
Patent Grant
Porous passage means and method for particle analyzing systems
Patent number
4,434,398
Issue date
Feb 28, 1984
Particle Data, Inc.
Robert H. Berg
G01 - MEASURING TESTING
Information
Patent Grant
Particle length and volume comeasurement with controlled orientation
Patent number
4,290,011
Issue date
Sep 15, 1981
Particle Data, Inc.
Robert H. Berg
G01 - MEASURING TESTING
Information
Patent Grant
Displacement metering with independent ancillary flow
Patent number
4,001,678
Issue date
Jan 4, 1977
Robert H. Berg
G01 - MEASURING TESTING