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Robert H. Fuerhoff
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St. Charles, MO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and systems for grain size evaluation of multi-cystalline s...
Patent number
9,136,185
Issue date
Sep 15, 2015
MEMC Singapore Pte., Ltd.
Gang Shi
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for continuously measuring silicon island elevation
Patent number
7,573,587
Issue date
Aug 11, 2009
MEMC Electronic Materials, Inc.
Zheng Lu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for controlling diameter of a silicon crystal...
Patent number
6,776,840
Issue date
Aug 17, 2004
MEMC Electronic Materials, Inc.
Robert H. Fuerhoff
C30 - CRYSTAL GROWTH
Information
Patent Grant
Method for preparing molten silicon melt from polycrystalline silic...
Patent number
6,454,851
Issue date
Sep 24, 2002
MEMC Electronic Materials, Inc.
Robert H. Fuerhoff
C30 - CRYSTAL GROWTH
Information
Patent Grant
Method and system for controlling growth of a silicon crystal
Patent number
6,171,391
Issue date
Jan 9, 2001
MEMC Electronic Materials, Inc.
Robert H. Fuerhoff
C30 - CRYSTAL GROWTH
Information
Patent Grant
Method for controlling growth of a silicon crystal
Patent number
5,882,402
Issue date
Mar 16, 1999
MEMC Electronic Materials, Inc.
Robert H. Fuerhoff
C30 - CRYSTAL GROWTH
Information
Patent Grant
System for controlling growth of a silicon crystal
Patent number
5,665,159
Issue date
Sep 9, 1997
MEMC Electronic Materials, Inc.
Robert H. Fuerhoff
C30 - CRYSTAL GROWTH
Information
Patent Grant
Non-distorting video camera for use with a system for controlling g...
Patent number
5,656,078
Issue date
Aug 12, 1997
MEMC Electronic Materials, Inc.
Robert H. Fuerhoff
C30 - CRYSTAL GROWTH
Information
Patent Grant
Method for controlling growth of a silicon crystal
Patent number
5,653,799
Issue date
Aug 5, 1997
MEMC Electronic Materials, Inc.
Robert H. Fuerhoff
C30 - CRYSTAL GROWTH
Patents Applications
last 30 patents
Information
Patent Application
Methods and Systems For Grain Size Evaluation Of Multi-Cystalline S...
Publication number
20130156293
Publication date
Jun 20, 2013
MEMC Singapore, Pte. Ltd.(UEN200614794D)
Gang Shi
G01 - MEASURING TESTING