Robert H. Moore

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Anitioch, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Sensor mount vibration reduction
- Patent number 8,573,057
- Issue date Nov 5, 2013
- Custom Sensors & Technologies, Inc.
- Robert H. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a tuning fork with reduced quadrature errro...
- Patent number 7,523,537
- Issue date Apr 28, 2009
- Custom Sensors & Technologies, Inc.
- Stuart J. Knowles
- G01 - MEASURING TESTING
Information Patent Grant
Inertial measurement system and method with bias cancellation
- Patent number 7,481,109
- Issue date Jan 27, 2009
- Custom Sensors & Technologies, Inc.
- Robert H. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Tuning fork with symmetrical mass balancing and reduced quadrature...
- Patent number 6,701,785
- Issue date Mar 9, 2004
- BEI Technologies, Inc.
- Stuart J. Knowles
- G01 - MEASURING TESTING
Information Patent Grant
Closed loop resonant rotation rate sensor
- Patent number 6,003,373
- Issue date Dec 21, 1999
- BEI Sensors & Systems Company, Inc.
- Robert H. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Low impedance single-ended tuning fork and method
- Patent number 5,939,631
- Issue date Aug 17, 1999
- BEI Technologies Inc.
- Robert H. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Rotation rate sensor with closed ended tuning fork
- Patent number 5,585,561
- Issue date Dec 17, 1996
- New S.D., Inc.
- Suneet Bahl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR MOUNT VIBRATION REDUCTION
- Publication number 20120291551
- Publication date Nov 22, 2012
- CUSTOM SENSORS & TECHNOLOGIES, INC.
- Robert H. Moore
- G01 - MEASURING TESTING
Information Patent Application
Inertial measurement system and method with bias cancellation
- Publication number 20070240486
- Publication date Oct 18, 2007
- Robert H. Moore
- G01 - MEASURING TESTING
Information Patent Application
Tuning fork and method with reduced quadrature error and symmetrica...
- Publication number 20020021059
- Publication date Feb 21, 2002
- BEI Technologies, Inc.
- Stuart J. Knowles
- G01 - MEASURING TESTING