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Robert H. Wardwell
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Colorado Springs, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
High density interconnect
Patent number
7,094,063
Issue date
Aug 22, 2006
Agilent Technologies, Inc.
Bob J. Self
G01 - MEASURING TESTING
Information
Patent Grant
High density, high frequency, board edge probe
Patent number
6,864,696
Issue date
Mar 8, 2005
Agilent Technologies, Inc.
Donald M. Logelin
G01 - MEASURING TESTING
Information
Patent Grant
Discrete connector termination adapter
Patent number
6,776,662
Issue date
Aug 17, 2004
Agilent Technologies, Inc.
Bob J. Self
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Connector termination adapter
Patent number
6,712,622
Issue date
Mar 30, 2004
Agilent Technologies, Inc.
Bob J. Self
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Portable wedge probe for perusing signals on the pins of an IC
Patent number
5,923,177
Issue date
Jul 13, 1999
Hewlett-Packard Company
Robert H. Wardwell
G01 - MEASURING TESTING
Information
Patent Grant
Connecting test equipment to adjacent legs of an IC or the like by...
Patent number
5,701,086
Issue date
Dec 23, 1997
Hewlett-Packard Company
Robert H. Wardwell
G01 - MEASURING TESTING
Information
Patent Grant
Wedge connector for integrated circuits
Patent number
5,507,652
Issue date
Apr 16, 1996
Hewlett-Packard Company
Robert H. Wardwell
G01 - MEASURING TESTING
Information
Patent Grant
Probe with contacts that interdigitate with and wedge between adjac...
Patent number
5,463,324
Issue date
Oct 31, 1995
Hewlett-Packard Company
Robert H. Wardwell
G01 - MEASURING TESTING
Information
Patent Grant
Connector assembly for testing integrated circuit packages
Patent number
5,205,741
Issue date
Apr 27, 1993
Hewlett-Packard Company
Michael J. Steen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Methods Of Making A Interconnect
Publication number
20060281342
Publication date
Dec 14, 2006
Bob J. Self
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for data capture
Publication number
20060214284
Publication date
Sep 28, 2006
Stuart Haden
G01 - MEASURING TESTING
Information
Patent Application
High density, high frequency, board edge probe
Publication number
20040085081
Publication date
May 6, 2004
Donald M. Logelin
G01 - MEASURING TESTING
Information
Patent Application
CONNECTOR TERMINATION ADAPTER
Publication number
20040063342
Publication date
Apr 1, 2004
Bob J. Self
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Discrete connector termination adapter
Publication number
20040063356
Publication date
Apr 1, 2004
Bob J. Self
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High density interconnect
Publication number
20040043640
Publication date
Mar 4, 2004
Bob J. Self
H01 - BASIC ELECTRIC ELEMENTS